Granted Patent
Utility
US 5,997,174 · App. 08/897,859
Method for determining a thermal parameter of a device by measuring thermal resistance of a substrate carrying the device
Inventor:
Christopher P. Wyland
Patented Case
View Patent ↗
Granted: Dec 7, 1999
Filed: Jul 21, 1997
Inventor
Christopher P. Wyland
Assignee (at issue)
Integrated Device Technology, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.