Granted Patent
Utility
US 6,002,989 · App. 08/831,298
System for quality control where inspection frequency of inspection apparatus is reset to minimize expected total loss based on derived frequency function and loss value
Inventors:
Masataka Shiba, Kenji Watanabe, Toshimitsu Hamada, Seiji Ishikawa, Naoki Go, Toshiaki Yachi, Tetsuya Watanabe, Takahiro Jingu
Patented Case
View Patent ↗
Granted: Dec 14, 1999
Filed: Apr 1, 1997
Inventors
Masataka Shiba
Kenji Watanabe
Toshimitsu Hamada
Seiji Ishikawa
Naoki Go
Toshiaki Yachi
Tetsuya Watanabe
Takahiro Jingu
Assignees (at issue)
HITACHI, LTD.
Hitachi Electronics Engineering Co., Ltd.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.