Granted Patent
Utility
US 6,006,348 · App. 09/030,917
Flip flop circuit for scan test with two latch circuits
Inventors:
Mikiko Sode, Yoichi Iizuka
Patented Case
View Patent ↗
Granted: Dec 21, 1999
Filed: Feb 26, 1998
Inventors
Mikiko Sode
Yoichi Iizuka
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.