Granted Patent
Utility
US 6,028,442 · App. 08/845,506
Test circuit for identifying open and short circuit defects in a liquid crystal display and method thereof
Inventors:
Gun-Won Lee, Jin Ho Choi
Patented Case
View Patent ↗
Granted: Feb 22, 2000
Filed: Apr 24, 1997
Inventors
Gun-Won Lee
Jin Ho Choi
Assignee (at issue)
SAMSUNG DISPLAY CO., LTD.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.