Granted Patent
Utility
US 6,031,271 · App. 09/188,378
High yield semiconductor device and method of fabricating the same
Inventor:
Kiyotaka Imai
Patented Case
View Patent ↗
Granted: Feb 29, 2000
Filed: Nov 10, 1998
Inventor
Kiyotaka Imai
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.