Granted Patent
Utility
US 6,031,386 · App. 08/962,465
Apparatus and method for defect testing of integrated circuits
Inventors:
Edward I. Cole, Jr., Jerry M. Soden
Patented Case
View Patent ↗
Granted: Feb 29, 2000
Filed: Oct 31, 1997
Inventors
Edward I. Cole, Jr.
Jerry M. Soden
Assignee (at issue)
Sandia Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.