IP Library Granted Patent US 6,035,262
Granted Patent Utility
US 6,035,262 · App. 08/266,431

Real time observation serial scan test architecture

Inventors: Walter E. Gibson, Jeffery A. Sprouse, Eduardo M. Lipiansky, Javad Khakbaz, Michael A. Plum, Philip Manela, Ko Yamamoto
Patented Case View Patent ↗
Granted: Mar 7, 2000 Filed: Jun 27, 1994
Inventors
Walter E. Gibson
Jeffery A. Sprouse
Eduardo M. Lipiansky
Javad Khakbaz
Michael A. Plum
Philip Manela
Ko Yamamoto
Assignee (at issue)
Tandem Computers Incorporated

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Quick Facts
Patent No.
US 6,035,262
App. No.
08/266,431
Filed
1994-06-27
Granted
2000-03-07
Kind
A