Granted Patent
Utility
US 6,038,019 · App. 09/084,229
Method for monitoring defects of semiconductor device
Inventors:
Hwan Chang, Hong-bae Moon
Patented Case
View Patent ↗
Granted: Mar 14, 2000
Filed: May 26, 1998
Inventors
Hwan Chang
Hong-bae Moon
Assignee (at issue)
SAMSUNG DISPLAY CO., LTD.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.