Granted Patent
Utility
US 6,043,670 · App. 08/991,867
Method for testing integrated circuits
Inventors:
Yinon Degani, Alan Michael Lyons
Patented Case
View Patent ↗
Granted: Mar 28, 2000
Filed: Dec 16, 1997
Inventors
Yinon Degani
Alan Michael Lyons
Assignee (at issue)
LUCENT TECHNOLOGIES INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.