Granted Patent
Utility
US 6,046,601 · App. 09/106,745
Method for measuring the kink effect of a semiconductor device
Inventors:
Meng-Lin Yeh, Yang-Hui Fang
Patented Case
View Patent ↗
Granted: Apr 4, 2000
Filed: Jun 30, 1998
Inventors
Meng-Lin Yeh
Yang-Hui Fang
Assignee (at issue)
United Semicondutor Circuit Corp.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.