Granted Patent
Utility
US 6,047,293 · App. 08/931,784
System for storing and searching named device parameter data in a test system for testing an integrated circuit
Inventor:
Alan L. Blitz
Patented Case
View Patent ↗
Granted: Apr 4, 2000
Filed: Sep 16, 1997
Inventor
Alan L. Blitz
Assignee (at issue)
Teradyne, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.