Granted Patent
Utility
US 6,057,679 · App. 09/096,812
Integrated circuit tester having amorphous logic for real-time data analysis
Inventors:
Roman A. Slizynski, Bryan J. Dinteman
Patented Case
View Patent ↗
Granted: May 2, 2000
Filed: Jun 12, 1998
Inventors
Roman A. Slizynski
Bryan J. Dinteman
Assignee (at issue)
Credence Systems Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.