Granted Patent
Utility
US 6,060,899 · App. 09/044,100
Semiconductor device with test circuit
Inventor:
Etsuo Hamada
Patented Case
View Patent ↗
Granted: May 9, 2000
Filed: Mar 19, 1998
Inventor
Etsuo Hamada
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.