IP Library › Granted Patent US 6,064,213
Granted Patent Utility
US 6,064,213 · App. 08/784,862

Wafer-level burn-in and test

Inventors: Igor Y. Khandros, David V. Pedersen
Patented Case View Patent ↗
Granted: May 16, 2000 Filed: Jan 15, 1997
Inventors
Igor Y. Khandros
David V. Pedersen
Assignee (at issue)
FormFactor, Inc.

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Quick Facts
Patent No.
US 6,064,213
App. No.
08/784,862
Filed
1997-01-15
Granted
2000-05-16
Kind
A