Granted Patent
Utility
US 6,067,161 · App. 09/216,094
Apparatus for measuring material thickness profiles
Inventors:
Michael A. Marcus, Jiann-Rong Lee, Harry Wayne Harris, Richard R. Kelbe
Patented Case
View Patent ↗
Granted: May 23, 2000
Filed: Dec 18, 1998
Inventors
Michael A. Marcus
Jiann-Rong Lee
Harry Wayne Harris
Richard R. Kelbe
Assignee (at issue)
EASTMAN KODAK COMPANY
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.