Granted Patent
Utility
US 6,067,262 · App. 09/209,938
Redundancy analysis for embedded memories with built-in self test and built-in self repair
Inventors:
V. Swamy Irrinki, Tuan Phan, William D. Schwarz
Patented Case
View Patent ↗
Granted: May 23, 2000
Filed: Dec 11, 1998
Inventors
V. Swamy Irrinki
Tuan Phan
William D. Schwarz
Assignee (at issue)
LSI Logic Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.