IP Library Granted Patent US 6,070,004
Granted Patent Utility
US 6,070,004 · App. 08/937,764

Method of maximizing chip yield for semiconductor wafers

Inventor: Frank Prein
Patented Case View Patent ↗
Granted: May 30, 2000 Filed: Sep 25, 1997
Inventor
Frank Prein
Assignee (at issue)
Siemens Aktiengesellschaft

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Quick Facts
Patent No.
US 6,070,004
App. No.
08/937,764
Filed
1997-09-25
Granted
2000-05-30
Kind
A