Granted Patent
Utility
US 6,072,737 · App. 09/130,632
Method and apparatus for testing embedded DRAM
Inventors:
Donald M. Morgan, Huy T. Vo
Patented Case
View Patent ↗
Granted: Jun 6, 2000
Filed: Aug 6, 1998
Inventors
Donald M. Morgan
Huy T. Vo
Assignee (at issue)
Micron Technology, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.