Granted Patent
Utility
US 6,073,263 · App. 08/960,014
Parallel processing pattern generation system for an integrated circuit tester
Inventors:
Brian J. Arkin, Garry C. Gillette, David S. Scott
Patented Case
View Patent ↗
Granted: Jun 6, 2000
Filed: Oct 29, 1997
Inventors
Brian J. Arkin
Garry C. Gillette
David S. Scott
Assignee (at issue)
Credence Systems Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.