Granted Patent
Utility
US 6,079,039 · App. 08/997,720
Test circuit and test method for testing semiconductor chip
Inventor:
Yoshiyuki Nakamura
Patented Case
View Patent ↗
Granted: Jun 20, 2000
Filed: Dec 23, 1997
Inventor
Yoshiyuki Nakamura
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.