Granted Patent
Utility
US 6,085,341 · App. 09/030,522
Memory test mode for wordline resistive defects
Inventors:
Jeffrey K. Greason, Daniel R. Grumbling
Patented Case
View Patent ↗
Granted: Jul 4, 2000
Filed: Feb 23, 1998
Inventors
Jeffrey K. Greason
Daniel R. Grumbling
Assignee (at issue)
Intel Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.