Granted Patent
Utility
US 6,091,652 · App. 09/209,907
Testing semiconductor devices for data retention
Inventors:
Steven L. Haehn, James P. Yakura
Patented Case
View Patent ↗
Granted: Jul 18, 2000
Filed: Dec 11, 1998
Inventors
Steven L. Haehn
James P. Yakura
Assignee (at issue)
LSI Logic Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.