Granted Patent
Utility
US 6,092,226 · App. 09/021,651
Fabrication of test logic for level sensitive scan on a circuit
Inventors:
Allen N. Kramer, Roger G. Brown, Eric Fischer
Patented Case
View Patent ↗
Granted: Jul 18, 2000
Filed: Feb 10, 1998
Inventors
Allen N. Kramer
Roger G. Brown
Eric Fischer
Assignee (at issue)
Cray Research, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.