Granted Patent
Utility
US 6,094,972 · App. 09/123,146
Sampling scanning probe microscope and sampling method thereof
Inventors:
Masatoshi Yasutake, Akira Inoue, Fumiki Sakai, Kazutoshi Watanabe, Tatsuya Miyatani
Patented Case
View Patent ↗
Granted: Aug 1, 2000
Filed: Jul 27, 1998
Inventors
Masatoshi Yasutake
Akira Inoue
Fumiki Sakai
Kazutoshi Watanabe
Tatsuya Miyatani
Assignee (at issue)
SEIKO INSTRUMENTS INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.