IP Library Granted Patent US 6,096,637
Granted Patent Utility
US 6,096,637 · App. 09/124,198

Electromigration-resistant via structure

Inventors: Tirunelveli S. Sriram, Ann C. Westerheim, John J. Maziarz, Vladimir Bolkhovsky
Patented Case View Patent ↗
Granted: Aug 1, 2000 Filed: Jul 28, 1998
Inventors
Tirunelveli S. Sriram
Ann C. Westerheim
John J. Maziarz
Vladimir Bolkhovsky
Assignee (at issue)
Compaq Computer Corporation

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Quick Facts
Patent No.
US 6,096,637
App. No.
09/124,198
Filed
1998-07-28
Granted
2000-08-01
Kind
A