Granted Patent
Utility
US 6,097,200 · App. 08/725,935
Modular, semiconductor reliability test system
Inventors:
Venu Turlapaty, Brent Dale Harry, Timothy Allen McMullen, Richard BENJAMIN
Patented Case
View Patent ↗
Granted: Aug 1, 2000
Filed: Oct 7, 1996
Inventors
Venu Turlapaty
Brent Dale Harry
Timothy Allen McMullen
Richard BENJAMIN
Assignee (at issue)
Aetrium, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.