Granted Patent
Utility
US 6,103,539 · App. 09/178,567
Method and system for nondestructive layer defect detection
Inventors:
William Schaffer, Jenn Liu
Patented Case
View Patent ↗
Granted: Aug 15, 2000
Filed: Oct 23, 1998
Inventors
William Schaffer
Jenn Liu
Assignee (at issue)
XMR, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.