Granted Patent
Utility
US 6,124,142 · App. 08/600,142
Method for analyzing minute foreign substance elements
Inventors:
Naohiko Fujino, Isamu Karino, Masashi Ohmori, Masatoshi Yasutake, Shigeru Wakiyama
Patented Case
View Patent ↗
Granted: Sep 26, 2000
Filed: Feb 12, 1996
Inventors
Naohiko Fujino
Isamu Karino
Masashi Ohmori
Masatoshi Yasutake
Shigeru Wakiyama
Assignee (at issue)
SEIKO INSTRUMENTS INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.