Granted Patent
Utility
US 6,137,300 · App. 09/138,331
Test probe device for a display panel and test probe positioning method
Inventor:
Manabu Hayashida
Patented Case
View Patent ↗
Granted: Oct 24, 2000
Filed: Aug 24, 1998
Inventor
Manabu Hayashida
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.