Granted Patent
Utility
US 6,144,596 · App. 09/188,410
Semiconductor memory test apparatus
Inventor:
Yeong-Chang Ahn
Patented Case
View Patent ↗
Granted: Nov 7, 2000
Filed: Nov 10, 1998
Inventor
Yeong-Chang Ahn
Assignee (at issue)
Hyundai Electronics Industries Co. Ltd.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.