Granted Patent
Utility
US 6,162,735 · App. 09/277,673
In-situ method for preparing and highlighting of defects for failure analysis
Inventors:
Gunnar Zimmermann, Rolf Christ, Mark Johnston
Patented Case
View Patent ↗
Granted: Dec 19, 2000
Filed: Mar 26, 1999
Inventors
Gunnar Zimmermann
Rolf Christ
Mark Johnston
Assignee (at issue)
Infineon Technologies North America Corp.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.