Granted Patent
Utility
US 6,167,355 · App. 09/342,526
High accuracy particle dimension measurement system
Inventor:
Peter Fiekowsky
Patented Case
View Patent ↗
Granted: Dec 26, 2000
Filed: Jun 29, 1999
Inventor
Peter Fiekowsky
Assignee (at issue)
Peter J. Fiekowsky
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.