Granted Patent
Utility
US 6,167,541 · App. 09/047,760
Method for detecting or preparing intercell defects in more than one array of a memory device
Inventors:
David D. Siek, Tim Damon
Patented Case
View Patent ↗
Granted: Dec 26, 2000
Filed: Mar 24, 1998
Inventors
David D. Siek
Tim Damon
Assignee (at issue)
Micron Technology, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.