IP Library Granted Patent US 6,204,075
Granted Patent Utility
US 6,204,075 · App. 09/310,136

Method of detecting defects in a wiring process

Inventor: Hiroaki Kikuchi
Patented Case View Patent ↗
Granted: Mar 20, 2001 Filed: May 12, 1999
Inventor
Hiroaki Kikuchi
Assignee (at issue)
NEC CORPORATION

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Quick Facts
Patent No.
US 6,204,075
App. No.
09/310,136
Filed
1999-05-12
Granted
2001-03-20
Kind
A