Granted Patent
Utility
US 6,204,076 · App. 09/312,481
Semiconductor device with unbreakable testing elements for evaluating components and process of fabrication thereof
Inventor:
Masanobu Zenke
Patented Case
View Patent ↗
Granted: Mar 20, 2001
Filed: May 17, 1999
Inventor
Masanobu Zenke
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.