Granted Patent
Utility
US 6,204,836 · App. 08/239,730
Display device having defect inspection circuit
Inventors:
Tsuneo Yamazaki, Kunihiro Takahashi, Hiroaki Takasu, Atsushi Sakurai
Patented Case
View Patent ↗
Granted: Mar 20, 2001
Filed: May 9, 1994
Inventors
Tsuneo Yamazaki
Kunihiro Takahashi
Hiroaki Takasu
Atsushi Sakurai
Assignee (at issue)
SEIKO INSTRUMENTS INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.