Granted Patent
Utility
US 6,216,239 · App. 08/931,201
Testing method and apparatus for identifying disturbed cells within a memory cell array
Inventor:
Chuen-Der Lien
Patented Case
View Patent ↗
Granted: Apr 10, 2001
Filed: Sep 15, 1997
Inventor
Chuen-Der Lien
Assignee (at issue)
Integrated Device Technology, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.