Granted Patent
Utility
US 6,223,129 · App. 09/078,400
Apparatus and method for conductivity measurement including probe contamination compensation
Inventors:
Wai Yin Cedric Chan, James W. Livingston
Patented Case
View Patent ↗
Granted: Apr 24, 2001
Filed: May 13, 1998
Inventors
Wai Yin Cedric Chan
James W. Livingston
Assignee (at issue)
Diversey Lever, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.