Granted Patent
Utility
US 6,233,706 · App. 09/169,320
Method and apparatus for limited access circuit test
Inventors:
Cherif Ahrikencheikh, Rodney A. Browen, William P. Darbie, John E. McDermid, Kay C. Lannen
Patented Case
View Patent ↗
Granted: May 15, 2001
Filed: Oct 9, 1998
Inventors
Cherif Ahrikencheikh
Rodney A. Browen
William P. Darbie
John E. McDermid
Kay C. Lannen
Assignee (at issue)
Agilent Technologies, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.