IP Library Granted Patent US 6,235,434
Granted Patent Utility
US 6,235,434 · App. 09/208,622

Method for mask repair using defect compensation

Inventors: Donald W. Sweeney, Avijit K. Ray-Chaudhuri
Patented Case View Patent ↗
Granted: May 22, 2001 Filed: Dec 8, 1998
Inventors
Donald W. Sweeney
Avijit K. Ray-Chaudhuri
Assignee (at issue)
EUV LLC.

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Quick Facts
Patent No.
US 6,235,434
App. No.
09/208,622
Filed
1998-12-08
Granted
2001-05-22
Kind
A