Granted Patent
Utility
US 6,239,426 · App. 09/348,319
Scanning probe and scanning probe microscope
Inventors:
Hiroshi Muramatsu, Katsunori Honma
Patented Case
View Patent ↗
Granted: May 29, 2001
Filed: Jul 7, 1999
Inventors
Hiroshi Muramatsu
Katsunori Honma
Assignee (at issue)
SEIKO INSTRUMENTS INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.