Granted Patent
Utility
US 6,239,604 · App. 08/859,592
Method for inspecting an integrated circuit by measuring a voltage drop in a supply line of sub-circuit thereof
Inventors:
Johannes P. M. Van Lammeren, Taco Zwemstra
Patented Case
View Patent ↗
Granted: May 29, 2001
Filed: May 20, 1997
Inventors
Johannes P. M. Van Lammeren
Taco Zwemstra
Assignee (at issue)
U.S. Philips Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.