Granted Patent
Utility
US 6,256,243 · App. 09/642,734
Test circuit for testing a digital semiconductor circuit configuration
Inventors:
Dominique Savignac, Wolfgang Nikutta, Michael Kund, Jan Ten Broke
Patented Case
View Patent ↗
Granted: Jul 3, 2001
Filed: Aug 17, 2000
Inventors
Dominique Savignac
Wolfgang Nikutta
Michael Kund
Jan Ten Broke
Assignee (at issue)
Infineon Technologies AG
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.