Granted Patent
Utility
US 6,259,093 · App. 09/201,182
Surface analyzing apparatus
Inventors:
Shigeru Wakiyama, Naohiko Fujino
Patented Case
View Patent ↗
Granted: Jul 10, 2001
Filed: Nov 30, 1998
Inventors
Shigeru Wakiyama
Naohiko Fujino
Assignees (at issue)
SEIKO INSTRUMENTS INC.
MITSUBISHI ELECTRIC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.