Granted Patent
Utility
US 6,259,264 · App. 09/385,378
Apparatus and method for testing semiconductor laser chips
Inventors:
Joseph Michael Freund, William Andrew Gault, John M. Geary
Patented Case
View Patent ↗
Granted: Jul 10, 2001
Filed: Aug 30, 1999
Inventors
Joseph Michael Freund
William Andrew Gault
John M. Geary
Assignee (at issue)
Agere Systems Optoelectronics Guardian Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.