Granted Patent
Utility
US 6,275,960 · App. 09/212,896
Self-test and correction of loss of charge errors in a flash memory, erasable and programmable by sectors thereof
Inventors:
Paolo Cappelletti, Alfonso Maurelli, Marco Olivo
Patented Case
View Patent ↗
Granted: Aug 14, 2001
Filed: Dec 16, 1998
Inventors
Paolo Cappelletti
Alfonso Maurelli
Marco Olivo
Assignee (at issue)
STMICROELECTRONICS S.r.l.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.