IP Library Granted Patent US 6,281,694
Granted Patent Utility
US 6,281,694 · App. 09/449,662

Monitor method for testing probe pins

Inventor: Meng-Jin Tsai
Patented Case View Patent ↗
Granted: Aug 28, 2001 Filed: Nov 30, 1999
Inventor
Meng-Jin Tsai
Assignee (at issue)
WINBOND ELECTRONICS CORP.

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Quick Facts
Patent No.
US 6,281,694
App. No.
09/449,662
Filed
1999-11-30
Granted
2001-08-28
Kind
A