Granted Patent
Utility
US 6,285,200 · App. 09/033,947
Apparatus and method for testing integrated circuit devices
Inventors:
Bradley D. Pace, Durbin L. Seidel, William Lawrence
Patented Case
View Patent ↗
Granted: Sep 4, 2001
Filed: Mar 2, 1998
Inventors
Bradley D. Pace
Durbin L. Seidel
William Lawrence
Assignee (at issue)
Agilent Technologies, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.