IP Library › Granted Patent US 6,287,380
Granted Patent Utility
US 6,287,380 · App. 09/057,907

Low defect density silicon

Inventors: Robert J. Falster, Joseph C. Holzer
Patented Case View Patent ↗
Granted: Sep 11, 2001 Filed: Apr 9, 1998
Inventors
Robert J. Falster
Joseph C. Holzer
Assignee (at issue)
MEMC Electronic Materials, Inc.

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Quick Facts
Patent No.
US 6,287,380
App. No.
09/057,907
Filed
1998-04-09
Granted
2001-09-11
Kind
A