Granted Patent
Utility
US 6,292,005 · App. 09/346,045
Probe card for IC testing apparatus
Inventor:
Kazunari Suga
Patented Case
View Patent ↗
Granted: Sep 18, 2001
Filed: Jul 7, 1999
Inventor
Kazunari Suga
Assignee (at issue)
Advantest Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.